Atomic Force Microscope (AFM)

Atomic Force Microscope (AFM)

Definition The atomic force microscope (AFM) is a type of scanning probe microscope whose primary roles include measuring properties such as magnetism, height, friction. The resolution is measured in a nanometer, which is much more accurate and effective than the optical diffraction limit. It uses a probe for measuring and collection of data involves touching the surface that has the …

Read moreAtomic Force Microscope (AFM)